The Planet Biometrics news-portal and its newsletters are designed to be the best in the business. The professional, content-rich site contains cutting-edge news, case histories, white papers, analysis, a directory and more. High-quality information is the hallmark of this site, which is targeted at decision makers in the government and commercial sectors. The international team of editors at Planet Biometrics is led by Mark Lockie, for more than a decade the Editor of the respected Biometric Technology Today journal and Conference Director of the Biometrics conference in London. Find out more at: www.planetbiometrics.com.
Unsupported Browser Detected
The browser you are using is not supported that will prevent you from accessing certain features of the website. We want you to have the best possible experience. For this you'll need to use a supported browser and upgrade to the latest version.