Paul Williams

Leader, High Power Laser Applications National Institute of Standards and Technology (NIST)

Digital Day 2

Tuesday, October 20th, 2020

14:00 Improving Laser Power Measurement Techniques

  • Assessing performance (output power) of new and existing HEL and HPM systems
  • New technologies enabling measurements of extremely high laser and microwave powers
  • Developments to assess accuracy of laser/microwave intensity distribution

Check out the incredible speaker line-up to see who will be joining Paul.

Download The Latest Agenda